Bist based low transition test pattern generation for minimizing test power in VLSI circutts /
Praveen, J.
Bist based low transition test pattern generation for minimizing test power in VLSI circutts / - xv, 179 p. ; 32 cm.
VLSI Testing VLSI Circuits Test Pattern Generator Linear Feedback Shift Register
621 PRA
Bist based low transition test pattern generation for minimizing test power in VLSI circutts / - xv, 179 p. ; 32 cm.
VLSI Testing VLSI Circuits Test Pattern Generator Linear Feedback Shift Register
621 PRA