Wellcome

Your search returned 2 results.

Sort
Unhighlight Highlight
Select all Clear all
Select titles to:
Results
Introduction to the characterization of residual stress by neutron diffraction [electronic resource] / M.T. Hutchings ... [et al.].

by Hutchings, Michael T.

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Boca Raton, FL : Taylor & Francis, 2005Online access: Distributed by publisher. Purchase or institutional license may be required for access. Availability: Items available for reference: Mysore University Main Library Not for loan (1) .
Log in to add tags Add to cart
Analysis of residual stress by diffraction using neutron and synchrotron radiation [electronic resource] / edited by M.E. Fitzpatrick and A. Lodini.

by Fitzpatrick, M. E. (Michael E.) | Lodini, Alain.

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: London ; New York : Taylor & Francis, 2003Online access: Distributed by publisher. Purchase or institutional license may be required for access. Availability: Items available for reference: Mysore University Main Library Not for loan (1) .
Log in to add tags Add to cart
Pages

No. of hits (from 9th Mar 12) :

web counter

Powered by Koha