TY  - BOOK
AU  - Lan,Rui
ED  - SpringerLink (Online service)
TI  - Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory
SN  - 9789811522178
AV  - TA404.6 
U1  - 620.11 23
PY  - 2020///
CY  - Singapore
PB  - Springer Singapore, Imprint: Springer
KW  - Materials science
KW  - Optical materials
KW  - Electronic materials
KW  - Semiconductors
KW  - Engineering-Materials
KW  - Electronic circuits
KW  - Phase transitions (Statistical physics)
KW  - Characterization and Evaluation of Materials
KW  - Optical and Electronic Materials
KW  - Materials Engineering
KW  - Electronic Circuits and Devices
KW  - Phase Transitions and Multiphase Systems
N1  - Introduction  -- Establishment of the hot strip method for thermal conductivity meausurements of Ge-Sb-Te alloys -- Thermal conductivities of Ge-Sb-Te alloys -- Electrical resistivities of Ge-Sb-Te alloys -- Thermal conduction mechanisms and prediction equations of thermal conductivity for Ge-Sb-Te alloys -- Densities of Ge-Sb-Te alloys -- Summary and conclusions.
N2  - This book focuses on the thermophysical properties of Ge-Sb-Te alloys, which are the most widely used phase change materials, and the technique for measuring them. Describing the measuring procedure and parameter calibration in detail, it provides readers with an accurate method for determining the thermophysical properties of phase change materials and other related materials. Further, it discusses combining thermal and electrical conductivity data to analyze the conduction mechanism, allowing readers to gain an understanding of phase change materials and PCM industry simulation
UR  - https://doi.org/10.1007/978-981-15-2217-8
ER  -