MARC details
| 000 -LEADER |
|---|
| fixed length control field |
03831nam a22005655i 4500 |
| 001 - |
|---|
| control field |
978-3-030-33260-0 |
| 003 - |
|---|
| control field |
DE-He213 |
| 005 - |
|---|
| control field |
20211012164711.0 |
| 007 - |
|---|
| fixed length control field |
cr nn 008mamaa |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
200309s2020 sz | s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783030332600 |
| -- |
978-3-030-33260-0 |
| 024 7# - |
|---|
| -- |
10.1007/978-3-030-33260-0 |
| -- |
doi |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| -- |
QC450-467 |
|
|---|
| -- |
QC718.5.S6 |
| 072 #7 - |
|---|
| -- |
PNFS |
| -- |
bicssc |
|
|---|
| -- |
SCI078000 |
| -- |
bisacsh |
|
|---|
| -- |
PNFS |
| -- |
thema |
|
|---|
| -- |
PDN |
| -- |
thema |
| 082 04 - |
|---|
| Classification number |
621.36 |
| -- |
23 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Kirkland, Earl J. |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Advanced Computing in Electron Microscopy |
| Statement of responsibility, etc |
by Earl J. Kirkland. |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
3rd ed. 2020. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
XII, 354 p. 146 illus., 8 illus. in color. |
| Other physical details |
online resource. |
| 505 0# - |
|---|
| Formatted contents note |
Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View. |
| 650 #0 - |
|---|
| Topical term or geographic name as entry element |
Spectroscopy. |
|
|---|
| Topical term or geographic name as entry element |
Microscopy. |
|
|---|
| Topical term or geographic name as entry element |
Optical data processing. |
|
|---|
| Topical term or geographic name as entry element |
Materials science. |
|
|---|
| Topical term or geographic name as entry element |
Spectroscopy and Microscopy. |
|
|---|
| Topical term or geographic name as entry element |
Image Processing and Computer Vision. |
|
|---|
| Topical term or geographic name as entry element |
Characterization and Evaluation of Materials. |
|
|---|
| Topical term or geographic name as entry element |
Biological Microscopy. |
|
|---|
| Topical term or geographic name as entry element |
Spectroscopy/Spectrometry. |
| 710 2# - |
|---|
| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 856 40 - |
|---|
| Uniform Resource Identifier |
https://doi.org/10.1007/978-3-030-33260-0 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| -- |
author. |
| -- |
aut |
| -- |
http://id.loc.gov/vocabulary/relators/aut |
| 245 10 - TITLE STATEMENT |
|---|
| -- |
[electronic resource] / |
| 264 #1 - |
|---|
| -- |
Cham : |
| -- |
Springer International Publishing : |
| -- |
Imprint: Springer, |
| -- |
2020. |
| 336 ## - |
|---|
| -- |
text |
| -- |
txt |
| -- |
rdacontent |
| 337 ## - |
|---|
| -- |
computer |
| -- |
c |
| -- |
rdamedia |
| 338 ## - |
|---|
| -- |
online resource |
| -- |
cr |
| -- |
rdacarrier |
| 347 ## - |
|---|
| -- |
text file |
| -- |
PDF |
| -- |
rda |
| 520 ## - |
|---|
| -- |
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. |
|
|---|
| -- |
https://scigraph.springernature.com/ontologies/product-market-codes/P31090 |
|
|---|
| -- |
https://scigraph.springernature.com/ontologies/product-market-codes/I22021 |
|
|---|
| -- |
https://scigraph.springernature.com/ontologies/product-market-codes/Z17000 |
|
|---|
| -- |
https://scigraph.springernature.com/ontologies/product-market-codes/L26000 |
|
|---|
| -- |
https://scigraph.springernature.com/ontologies/product-market-codes/C11020 |
| 773 0# - |
|---|
| -- |
Springer Nature eBook |
| 776 08 - |
|---|
| -- |
Printed edition: |
| -- |
9783030332594 |
|
|---|
| -- |
Printed edition: |
| -- |
9783030332617 |
|
|---|
| -- |
Printed edition: |
| -- |
9783030332624 |
| 912 ## - |
|---|
| -- |
ZDB-2-PHA |
|
|---|
| -- |
ZDB-2-SXP |
| 950 ## - |
|---|
| -- |
Physics and Astronomy (SpringerNature-11651) |
|
|---|
| -- |
Physics and Astronomy (R0) (SpringerNature-43715) |
