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Software patterns, knowledge maps, and domain analysis /

Fayad, Mohamed E.

Software patterns, knowledge maps, and domain analysis / Mohamed E. Fayad - Boca Raton : CRC Press, 2015. - xxv, 422 p. ; 25 cm.

Includes index.

ISBN: 9781466571433

Subjects--Topical Terms:
Knowledge management
Software patterns

Dewey Class. No.: 658.4038 FAY S

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